Study on low-refractive-index sol-gel SiO_2 antireflective coatings  

Study on low-refractive-index sol-gel SiO_2 antireflective coatings

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作  者:沈斌 李海元 熊怀 张旭 唐永兴 

机构地区:[1]Key Laboratory of High Power and Physics, Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences

出  处:《Chinese Optics Letters》2016年第8期90-92,共3页中国光学快报(英文版)

摘  要:A study on low-refractive-index SiO2 antireflective(AR) coatings by a sol-gel method is reported. Variations in the properties of the coatings are related to the molar ratios of ammonia to deionized water being changed in the process of preparing the sols. From the performance test results, the optimal ratio of the reactants necessary to prepare low-refractive-index SiO2 AR coatings is determined. Of all the SiO2 AR coatings, the lowest recorded refractive index is 1.16 at a wavelength of 700 nm. The largest water contact angle is 121.2°, and the peak transmittance is 99.95% at a wavelength of 908 nm. Furthermore, the sol used to deposit the film with the lowest refractive index is stable because of the narrow size distribution of its constituent particles.A study on low-refractive-index SiO2 antireflective(AR) coatings by a sol-gel method is reported. Variations in the properties of the coatings are related to the molar ratios of ammonia to deionized water being changed in the process of preparing the sols. From the performance test results, the optimal ratio of the reactants necessary to prepare low-refractive-index SiO2 AR coatings is determined. Of all the SiO2 AR coatings, the lowest recorded refractive index is 1.16 at a wavelength of 700 nm. The largest water contact angle is 121.2°, and the peak transmittance is 99.95% at a wavelength of 908 nm. Furthermore, the sol used to deposit the film with the lowest refractive index is stable because of the narrow size distribution of its constituent particles.

关 键 词:refractive ammonia transmittance prepare molar narrow preparing viscosity silica constituent 

分 类 号:TQ127.2[化学工程—无机化工] TH811[机械工程—仪器科学与技术]

 

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