光学元件外径的机器视觉测量技术研究  

Research on machine vision measurement technology for measuring optical element diameter

作　　者：许楠楠[1] 刘缠牢[1] 

机构地区：[1]西安工业大学光电工程学院,陕西西安710021

出　　处：《光学仪器》2016年第4期292-296,共5页Optical Instruments

摘　　要：基于机器视觉技术,采用平行光投影获取光学元件轮廓图像,通过行扫描提取目标,使用最小二乘线性回归边缘检测方法,将直线边缘定位精度达到亚像素级别,使测量精度达到微米级。实验结果表明,采用机器视觉的非接触测量方法可以实现对光学元件外径的快速准确测量。Based on machine vision technology, we use the parallel light projection to obtainoptical element contour image. By line scan to extract target, we use the least squares linearregression edge detection method and achieve the linear edge location accuracy to sub-pixellevel so that measurement precision can reach micron level. The experimental results showthat the machine vision method of non-contact measurement can achieve fast and accuratemeasurement of the optical element diameter.

关 键 词：机器视觉 目标提取 亚像素边缘检测 

分 类 号：TN274[电子电信—物理电子学]