硬化伪影的新型表现形式及其校正  

Form and correction of a new type of artifact induced by beam hardening

作　　者：陈云斌[1,2] 陈思[1,2] 李敬[1,2] 

机构地区：[1]中国工程物理研究院应用电子学研究所,四川绵阳621900 [2]国家X射线数字化成像仪器中心,四川绵阳621000

出　　处：《强激光与粒子束》2016年第10期83-87,共5页High Power Laser and Particle Beams

基　　金：中国工程物理研究院应用技术开发项目(JMZD201302)

摘　　要：X射线硬化是导致工业CT重建图像质量下降的物理原因之一。硬化伪影通常表现为两种形式,即杯状伪影和带状伪影。描述并证实了硬化伪影的一种新型表现形式,这种伪影与真实结构相关,且分布规则,容易造成伪影与真实结构的混淆。采用线性化校正方法对该伪影进行抑制,提高了重建图像质量,改善了通过CT重建图像进行几何测量的精度。X-ray beam hardening is one of the physical processes that degrade the quality of ICT reconstructed images. Commonly, beam hardening artifacts perform as cupping artifacts and streak artifacts. This paper illustrates and demonstrates a new type of beam hardening artifact. It is closely related to the structure of object. In addition, it is obscure between artifacts and real structures due to regular distribution of artifacts. Linear correction method was applied to suppress artifacts. The quality of reconstructed image is increased, and the accuracy of dimensional metrology is also improved.

关 键 词：工业CT 射束硬化 杯状伪影 带状伪影 几何测量 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]