X波段脉冲空间行波管输出结构可靠性研究  

Study of the Reliability of the Output Structure for X-band Space Traveling Wave Tube

作　　者：尚新文[1,2,3] 李鑫伟[1,2,3] 曹林林[1,2] 肖刘[1,2] 苏小保[1,2] 

机构地区：[1]中国科学院电子学研究所,北京100190 [2]中国科学院高功率微波源与技术重点实验室,北京101400 [3]中国科学院大学,北京100049

出　　处：《电子与信息学报》2016年第10期2674-2680,共7页Journal of Electronics & Information Technology

基　　金：国家科技重大专项(2012ZX01007004001);国家自然科学基金(61401427);中科院国防科技创新基金(CXJJ-16Q137)~~

摘　　要：X波段脉冲空间行波管主要用于轻型SAR等雷达系统,要求行波管具有高功率、高效率、高可靠的性能。输出结构是行波管的重要部件,其可靠性不仅影响行波管的输出功率等性能,还影响行波管的稳定性与可靠性。该文针对X脉冲空间行波管输出结构进行可靠性研究,通过电、磁、热多物理场耦合的方式对它进行热、力结构可靠性分析,按分析结果对输出结构薄弱环节进行改进,耐冲击能力增强,并经过1000 h以上的整管老练及空间环境试验验证,输出结构具有较高的可靠性,满足空间环境试验及使用要求。X-band pulsed space Traveling Wave Tube （TWT） is mainly used in such radar system as light-weight SAR, which is required to have high power, high efficiency and high reliability. The output structure is an important part of the TWT, and its reliability not only affects the output power of TWT, but also influences the stability and reliability of the TWT. In this paper, the reliability of the output structure of an X-band pulsed space TWT is studied. The thermal and structural reliability is studied by means of multi-physics coupling including electrical and magnetic. The shock resistance ability of the output structure is improved according to the analysis results. Furthermore, in the course of above 1000 hours aging and space environmental test, the output structure has high reliability, meeting the space environment test and use requirements.

关 键 词：脉冲空间行波管 多物理场耦合 输出结构 可靠性 

分 类 号：TN124[电子电信—物理电子学]