A snake addressing scheme for phase change memory testing  

作　　者：Xiaole CUI Zuolin CHENG Chunglen LEE Xinnan LIN Yiqun WEI Xiaogang CHEN Zhitang SONG 

机构地区：[1]Key Laboratory of Integrated Microsystems, Peking University Shenzhen Graduate School [2]State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Micro-System and Information Technology, Chinese Academy of Sciences

出　　处：《Science China(Information Sciences)》2016年第10期218-228,共11页中国科学（信息科学）（英文版）

基　　金：supported by National Basic Research Program of China (973) (Grant Nos. 2015CB057201, 2013CBA01903);R&D project of the Shenzhen Government, China (Grant Nos. JCYJ20140417144423194, JCYJ20140417144423198)

摘　　要：Phase change memory （PCM） is one of the most promising candidates for next generation nonvolatile memory. However, PCM suffers from a variety of faults due to its special device structure and operation mechanism. A snake addressing scheme is introduced into the test algorithms of PCM to reduce the test time and excite proximity disturb faults more effectively. The March test algorithm with the proposed snake addressing scheme is less complex than most traditional test algorithms. In addition to conventional faults, it is capable of covering disturb and parasitic faults. Moreover, when incorporated with the sneak path testing method, it is able to test the read fault, read recovery fault, incomplete program fault O, and false write fault.Phase change memory （PCM） is one of the most promising candidates for next generation nonvolatile memory. However, PCM suffers from a variety of faults due to its special device structure and operation mechanism. A snake addressing scheme is introduced into the test algorithms of PCM to reduce the test time and excite proximity disturb faults more effectively. The March test algorithm with the proposed snake addressing scheme is less complex than most traditional test algorithms. In addition to conventional faults, it is capable of covering disturb and parasitic faults. Moreover, when incorporated with the sneak path testing method, it is able to test the read fault, read recovery fault, incomplete program fault O, and false write fault.

关 键 词：phase change memory fault model snake addressing mode March test algorithm sneak path testmethod 

分 类 号：TP333[自动化与计算机技术—计算机系统结构] TP393[自动化与计算机技术—计算机科学与技术]