紫外成像光谱仪干涉图零级漂移现象分析  

Zero-Order Drift of Interferograms in Ultraviolet Imaging Spectrometer

作　　者：吕航[1] 廖宁放[1] 吴文敏[1] 曹玮亮[1] 王佳佳[1] 程灏波[2] 

机构地区：[1]北京理工大学光电学院光电成像技术与系统教育部重点实验室,北京100081 [2]北京理工大学深圳研究院,广东深圳518057

出　　处：《光学学报》2016年第9期104-111,共8页Acta Optica Sinica

基　　金：国家自然科学基金(61575020);国家科技支撑计划(2012BAK02B04);公安部重点研究计划(2010ZDYJBJLG006);广东省科技计划(2015A020214004)

摘　　要：零级漂移存在于时空联合调制型紫外傅里叶变换成像光谱仪干涉图中。对干涉结构中分束体光路的计算表明,分束体中的光学胶和棱镜在紫外波长范围内的折射率变化会导致零级漂移。但是棱镜装配错位会使零级漂移更为严重,导致有效干涉信息丢失及反演光谱曲线失真。数值仿真结果表明,提高分束体装配精度,可避免有效干涉信息的丢失。实际测量结果表明,含固有零级漂移的时空联合调制型干涉成像光谱仪的反演光谱曲线与高分辨率光谱仪测量数据一致。当分束体装配精度较高时,零级漂移不会影响成像光谱仪测量的准确性。Zero-order drift is inherently present in the interferogram of a spatially temporally modulated ultraviolet Fourier-transform imaging spectrometer. The calculation of optical path of beam splitter in interferometric structure indicates that the zero-order drift is caused by refractive index variation in the ultraviolet wavelength range of optical adhesive and prism in the beam splitter. However, assembly misalignment of the prism may cause more serious zero-order drift, resulting in loss of the effective interference information and distortion of the spectral curve. The numerical simulation results verify that it is necessary to improve the assembly precision of the beam splitter to avoid loss of effective interference information. The measurement results show that the spectral inversion curve of the spatially＇temporally modulated interferometric imaging spectrometer which contains inherent zero-order drift is consistent with the measurement result of a high-resolution spectrometer. When the beam splitter has high assembly precision, the zero-order drift does not affect the measurement accuracy of the imaging spectrometer.

关 键 词：成像系统 零级漂移 光谱反演 分束体 紫外 

分 类 号：TH744[机械工程—光学工程]