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机构地区:[1]西安理工大学自动化与信息工程学院,西安710048
出 处:《电子测量与仪器学报》2016年第9期1432-1437,共6页Journal of Electronic Measurement and Instrumentation
基 金:国家自然科学基金(U1433110)资助项目
摘 要:针对光散射粒子测量方法中测量结果受到外界杂散光干扰这一问题,提出将日盲紫外光应用于光散射粒子测量方法中。利用Mie散射理论仿真了日盲紫外光不同粒径粒子的散射光分布函数,结果表明,日盲紫外光对粒径较小的粒子散射特性良好,能够应用于光散射粒子测量方法之中。利用T矩阵方法计算了日盲紫外光椭球粒子的散射特性,结果表明,在日盲紫外光248 nm处,椭球粒子的消光截面相比等效球形粒子偏小2.82%,散射截面偏小1.95%。最后分析了椭球粒子形变参数与复折射率对其散射相函数的影响,这些分析为光散射粒子测量方法提供了一定的理论依据。Aiming at the measurement result of light scattering measurement method disturbed by stray light of external, the method applying blind UV to light scattering particle measurement is proposed. Mie theory is used to simulate the scattered light' s distribution function of particles of different size at blind UV, and the result shows that blind UV has good scattering characteristics to smaller panicles which can be used in light scattering panicle measurement method. This paper uses T-matrix to calculate the scattering characteristics of ellipsoid panicles at blind UV, and the result shows that at 248 nm of blind UV, the ellipsoid panicles' extinction section is low 2. 82% and the scattering section is lower 1.95% compared with equivalent spherical particles. At last, the influence of ellipsoid particles' shape change and refractive index to the scattering phase function is analyzed, this analysis provide some theoretical foundations of light scattering panicle measurement theory.
分 类 号:TN98[电子电信—信息与通信工程]
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