工艺偏差对干式空心电抗器局部温升的影响分析研究  

Impact of Process Parameter Variation on Temperature Rise of Dry-type Air-core Shunt Reactor

作　　者：王岩[1,2] 谭向宇[1] 束洪春[2] 陈晶[1] 郭小兵[1,2] 吴彦霖[1,2] 张轩[1,2] 王永红[3] 

机构地区：[1]云南电网公司研究生工作站,昆明650217 [2]昆明理工大学,昆明650500 [3]哈尔滨理工大学电气与电子工程学院,哈尔滨150080

出　　处：《高压电器》2016年第10期182-186,共5页High Voltage Apparatus

摘　　要：由于干式空心并联电抗器支路数非常多,工艺偏差会造成干式空心电抗器局部温升差异。局部温升过高会导致干式空心并联电抗器局部绝缘过早老化,降低干式空心电抗器的运行年限。因此文中针对BKDK-20000/35型干式并联空心电抗器进行模型建立,通过有限元数值计算分析,得到了不同整体半径、包封间距和匝数偏差情况下温升的变化进行研究,结果表明对于不同的工艺偏差类型,整体半径偏差引起各包封温升产生较小的变化,包封间距偏差引起各包封温升产生较大变化,匝数偏差引起各包封温升产生明显变化。为进一步控制干式空心并联电抗器生产过程工艺偏差量提供依据。Process parameter deviation may result in variation of local temperature rise of a dry-type air-core shunt reactor because the reactor contains many branches. Excessive local temperature rise will lead to early aging of local insulation of the reactor, reducing its service life. In this article, a model of BKDK-20000/35 dry-type air- core shunt reactor is established via finite element analysis, and the variations of temperature rise are obtained under different deviations of whole radius, encapsulation pitch, and number of turns.The results show that the overall radius deviation causes small change in temperature rise of encapsulation, the encapsulation pitch deviation causes significant change in temperature rise of encapsulation, and the number of turns deviation causes great change in temperature rise of encapsulation. This study may deviation in manufacturing dry-type air-core shunt reactors. provide a reference for control of process parameter

关 键 词：干式空心电抗器 工艺偏差 包封 局部 温升 

分 类 号：TM47[电气工程—电器]