针对纳米器件缺陷的CMOL电路单元容错映射  

Defect-tolerant Cell Mapping in CMOL Circuit with Defect Nanodevices

作　　者：汪纪波[1] 夏银水[1] 储著飞[1] 

机构地区：[1]宁波大学信息科学与工程学院,宁波315211

出　　处：《无线通信技术》2016年第3期46-51,共6页Wireless Communication Technology

基　　金：国家自然科学基金(No.61571248)

摘　　要：针对CMOL电路中的纳米二极管常闭缺陷的容错映射问题,提出了一种启发式容错映射算法。首先分析纳米二极管常闭缺陷对电路单元映射的影响,以电路中错误的连接数为成本值,采用评价、选择和配置循环迭代,直到容错映射成功。与已有的可满足性方法相比,在一个较合理的时间内可以求解更大规模的电路。For the problem of defect-tolerant cellmapping in CMOL circuit with stuck-close nanode-vices, an effective heuristic algorithm is proposedcell mapping is analyzed; then takingby evaluation, selection and allocationg Firstly, the impact of stuck - close defects onthe fault connections of circuit asis carried out until defect-tolerantexperiment results indicate that compared with the satisfiability method,solve large scale circuits in a reasonable time.cost function, the iterationmapping successfully. The the proposed method can

关 键 词：纳米电路 CMOL电路 容错映射 常闭缺陷 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]