浅析IC测试开发流程及量产数据对产品设计的影响  

Simply analysing the influence of integrated circuit test development process and production data on production design

作　　者：伍凤娟 王媛媛[1] Wu Fengjuan Wang Yuanyuan(College of Electrical and Control Engineering, Xi＇ an University of Science and Technology ,Xi＇ an 710054,China)

机构地区：[1]西安科技大学电气与控制工程学院,陕西西安710054

出　　处：《微型机与应用》2016年第20期31-33,共3页Microcomputer & Its Applications

摘　　要：集成电路行业作为信息产业的基础,其应用领域上至国防军工下至家用电器。测试技术是检测集成电路质量好坏的重要环节,对集成电路进行测试可有效提高芯片的成品率。测试的主要目的是保证芯片在恶劣环境下能完全实现设计规格书所规定的功能及性能指标。主要论述半导体后道测试对产品工艺的影响,旨在降低测试成本,提高测试质量及测试精度。Integrated circuit industry ranges from national defense to household appliances as the basis of information industry. Testing technology is quite important to detect integrated circuit quality,and detecting integrated circuit is effective to improve chip yield. The main purpose of testing is to fully ensure to realize the function or performance that the design specification stipulated when chips are under severe environment. This article mainly discusses how the semiconductor later process testing influence the production process,in order to reduce the test cost and improve the testing quality and testing accuracy.

关 键 词：半导体 集成电路测试 量产数据 产品工艺 

分 类 号：TN407[电子电信—微电子学与固体电子学]