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作 者:杨海梅[1] 赵龙[1] 王庆娥[1] 杨松[1] 张骏[1]
机构地区:[1]烟台大学光电信息科学技术学院,山东烟台264005
出 处:《光电技术应用》2016年第4期42-45,共4页Electro-Optic Technology Application
摘 要:在光学测量领域中,干涉法具有极其重要的意义。针对干涉条纹图相位的提取,提出了一种基于二维连续小波变换的干涉条纹图相位提取的新方法。在文中提出的算法中,为了降低计算时间,在计算过程中引入快速傅里叶变换,并提出将传统二维连续小波变换中的连续的尺度因子和旋转角用离散的尺度因子和旋转角代替,这样就解决了二维连续小波变换算法计算耗时的问题。通过仿真和实验发现,该方法可以快速准确的提取出干涉条纹图的相位,对于有缺陷的干涉条纹图,可以实现缺陷的修复并获得其相位图,并收到了比较不错的效果。In the field of optical measurement, interferometry has extremely important significance. For phaseextraction of fringe pattern, a new algorithm based on two-dimensional continuous wavelet is proposed. For reducingcalculation time, the fast Fourier transform is adopted to the process and discrete scale factors and rotation anglesare chosen instead of continuous scale factors and rotation angles used in traditional two-dimensional continuouswavelet transform. So the long calculation time issue for two-dimensional continuous wavelet transform algorithm isresolved. Simulations and experiments show that the phases of fringe patterns can be extracted fast and accuratelywith the algorithm. For the fringe patterns with defects, image inpainting can be realized and the phase patterns canbe obtained. And a good effect is obtained.
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