太赫兹平板材料介电常数测试技术  

The Permeability and Permittivity Measurement Technique of Flat Substrate Materials at Terahertz

作　　者：胡大海 赵锐[2] 杜刘革[2] 王亚海[2] HU Da-hai ZHAO Rui DU Liu-ge WANG Ya-hai(Science and Technology on Test ＆ Measurement Laboratory, Qingdao 266555, China The 41st Institute of China Electronics Technology Group Corporation, Qingdao 266555 ,China)

机构地区：[1]电子测试技术重点实验室,青岛266555 [2]中国电子科技集团公司第四十一研究所,青岛266555

出　　处：《微波学报》2016年第5期1-5,共5页Journal of Microwaves

基　　金：中电集团专项资金项目(Z085)

摘　　要：讨论了太赫兹波段平板材料的介电常数测试技术,在传统自由空间法原理的基础上,改进相位-群时延法解决了高频材料测试出现的多值性问题,利用介电常数及磁导率之间的震荡关系解决了厚度谐振问题,采用多项式曲线拟合的方式抑制校准误差,最后搭建了实物测试系统,对典型的空气层、聚四氟乙烯平板材料进行实验测量,实现了0.17-0.22 THz频段范围内的2%误差测试精度。The permeability and permittivity measurement technique of flat substrate materials at terahertz is presented in this paper. An improved phase-group delay method is researched for multi-value problem on dielectric constants measurement at high frequency based the traditional free-space theory. Oscillation relationship between the permeability and permittivity is used for eliminating the thickness-resonance problem. Error caused by calibration is suppressed based on fitting the material properties to polynomials. Examples of measuring air and a teflon substrate with a test system are given at last,proving that it is able to achieve an error precision of 2% from 0. 17 THz to 0. 22 THz.

关 键 词：太赫兹 材料测试 自由空间法 

分 类 号：TB302[一般工业技术—材料科学与工程]