基于TDS系统的超大型测试向量生成技术研究  

Research of Ultra-large Size Test Vector Generation Based on TDS System

作　　者：石志刚 刘伟 金兰 吉国凡 

机构地区：[1]北京确安科技股份有限公司,北京100094

出　　处：《微处理机》2016年第5期17-20,24,共5页Microprocessors

摘　　要：超大型测试向量生成技术是数字电路芯片测试中的难点,对芯片测试效率和产品良率都有较大影响。介绍一种基于TDS向量生成系统的超大型测试向量生成技术。阐述了TDS向量生成系统的体系结构,以某超大型测试向量的生成过程为例,介绍该系统使用模块化方式生成超大型测试向量的方法,并对具体生成方案进行分析,使用裁剪、压缩等多种优化手段完成测试向量生成,保证测试向量的简洁和准确。生成后的向量可以成功载入目标测试系统,极大节省了测试系统资源。通过该方法,实现了超大型测试向量的高效生成,极大地减小了测试向量的体积,提高了工程量产测试效率。The generation technology of the ultra - large size test vector is a difficult point in the test of digital circuit chip, which has a great influence on the test efficiency and the yield. In this paper, an ultra - large size test vector generation technique based on TDS system is introduced. It describes the structure of test vector generation system, takes the generation process of an ultra - large size test vector as an example, introduces the method of generating an ultra - large size test vector with system modularization, and carries on the analysis to the main module. Using cutting, compression and other methods of optimization to complete the test vector generation, ensure that the generated test vector is simple and accurate. Through this method, we can achieve high efficiently conversion of the ultra - large size test vector, which greatly reduces the size of the test vector and improves the efficiency of mass production test.

关 键 词：芯片测试系统 系统架构 向量生成 优化 压缩 模块化 

分 类 号：TN47[电子电信—微电子学与固体电子学]