陶瓷基片外观检测及分拣系统设计  

Design of Appearance Detection and Sorting System of Ceramic Substrate

作　　者：梁亮[1] 闫学文[1] 

机构地区：[1]太原科技大学电子信息与工程学院,山西太原030024

出　　处：《工业控制计算机》2016年第10期53-55,共3页Industrial Control Computer

摘　　要：主要检测陶瓷基片的表面光滑度(划痕、缺损、裂纹),重点检测陶瓷基片的外形尺寸、是否垂直的检测,并结合检测结果对产品进行自动分拣,并显示检测参数。用这个方法解决人为因素及检测精度和实时性的问题。介绍了系统硬件平台的结构和运行过程,设计了改进的推杆控制电路。修改并移植了工业摄像头的驱动程序,详细阐述了图像从采集到得到像素坐标的过程和关键步骤,设计了ARM与PLC的PPI通信,最终完成对基片的自动分拣。This paper mainly the detection surface smoothness ceramic substrate（scratches,defects,cracks）,focuses on the detection of the ceramic substrate dimensions, whether vertical detection,combined detection result of the product for automatic sorting, and displaying the detected parameters.Use this method to resolve the human factor and the detection accuracy and real-time problem.The structure and operation of process systems hardware platform designed to improve putting control circuit.Modified and transplanted industrial camera driver,elaborated from image acquisition to get the pixel coordinates processes and key steps designed PPI and PLC communication ARM,the final completion of the substrate automatic sorting.

关 键 词：LINUX移植 USB摄像头 图像采集 图像处理系统 PLC分拣 

分 类 号：TQ174.66[化学工程—陶瓷工业] TP391.41[化学工程—硅酸盐工业]