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作 者:白天予 Paul.L.Lewin
机构地区:[1]国网天津市电力公司东丽供电分公司,天津300300 [2]The Tony Davies High Voltage Laboratory,University of Southampton
出 处:《大众科技》2016年第8期62-65,共4页Popular Science & Technology
摘 要:文章是对于发生在交流电场中在固体绝缘介质的空气间隙的老化进程的实验,通过制造一个在2mm厚度的硅胶样品包含直径1mm的单个的空气间隙,五个样品在12k V的交流电场下加压6小时而后加压到15k V直到有一个样品击穿。在加压过程中,局部放电数据被常规的记录下来。剩下的4个样品将被检查是否有老化的痕迹。初步结果显示,被切割的样品的老化部分有可能是凹凸部分从空气间隙中延伸出来。这篇论文详细介绍这个实验,以及包含获得的老化的样品的照片和详细介绍因为电老化过程对化学成分的变化在硅胶中的影响。This paper is concerned with a simulation study to consider comparison of partial discharge measurement and simulation results for degradation processes. The experimental samples are 2mm thick samples of silicone resin that contain a single void of around 1mm diameter. Five samples are simultaneously electrically stressed under an applied ac sinusoidal voltage of 12kV for 6 hours that is then increased to 15kV until a sample fails. During the stressing period, PD data is regularly acquired. The remaining 4 samples are then inspected for signs of degradation. Preliminary results show that the aging sample is likely to be concave and convex part extends from the air gap. This paper introduces the experiment in detail, containing the photos of the aging sample and the influences on silica gel by the change of the chemical composition in electrical aging process.
分 类 号:TM852[电气工程—高电压与绝缘技术]
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