Ba(Zr_(0.15)Ti_(0.85))O_3厚膜的介电与铁电性能研究  

Dieletric and Ferroelctric Properties of Ba(Zr_(0.15)Ti_(0.85))O_3 Thick Film

作　　者：张营堂[1,2] 闫欠 

机构地区：[1]河南工学院电气工程系,新乡453003 [2]陕西理工大学材料学院,汉中723001

出　　处：《无机材料学报》2016年第11期1219-1222,共4页Journal of Inorganic Materials

基　　金：中国博士后基金(2015M572541);电力设备电气绝缘国家重点实验室开放课题(EIPE11207);工程电介质及其应用教育部重点实验室项目(DE2011A01)~~

摘　　要：本研究采用流延法制备Ba(Zr_(0.15)Ti_(0.85))O_3(BZT)厚膜样品。采用扫描电子显微镜分析样品形貌;采用LCR测试仪和Sawyer-Tower电路法测量样品的介电与铁电性能。结果表明,BZT厚膜具有明显的介电弛豫特征,击穿电场强度可达60 k V/cm以上,饱和极化强度可达58.1mC/cm^2,剩余极化强度(Pr)为20.9mC/cm^2。Ba（Zr0.15Ti0.85）O3 （BZT） thick film was prepared by a tape-casting technique and its morphology was characterized by scanning electron microscope （SEM）. Its dielectric and ferroelectric properies were investigated using LCR meter and Sawyer-Tower circuit. The results indicate that there is obvious dielectric relaxation behavior in BZT thick film. Its breakdown field strength, saturated polarization and remnant polarization are 60 kV/cm, 58.1 μC/cm2 and 20.9 μC/cm2, respectively.

关 键 词：BZT 厚膜 介电弛豫 

分 类 号：TB34[一般工业技术—材料科学与工程]