临界路径跟踪算法中自屏蔽和多路敏化现象的研究  

Study on Self-Masking and Multiple Path Sensitization of Critical Path Tracing Algorithm

作　　者：侯明星[1] 何亮[1] 黄斌科[1] 张喜俊[2] 

机构地区：[1]西安交通大学电子与信息工程学院,陕西西安710049 [2]中国电子科技集团公司第四十一研究所,山东青岛266555

出　　处：《微电子学与计算机》2016年第11期99-103,共5页Microelectronics & Computer

摘　　要：目前临界路径跟踪算法中确定扇出源临界性时,未同时考虑扇出源的自屏蔽和多路敏化现象,进而导致处理结果出现近似问题,对此研究了自屏蔽和多路敏化现象对扇出源临界性的影响,提高了算法的准确性.通过使用18值符号仿真,可以同时检测固定故障和跳变时延故障,提高了算法的有效性.使用C++编程语言对改进后的临界路径跟踪算法进行实现,并应用于ISCAS’85标准电路进行故障模拟,实验结果证明了该算法的准确性和高效性.Current critical path tracing algorithm will lead approximation of results in fault diagnosis, since self- masking and multiple path sensitization in determining criticality of fan-out stem are not considered. The present paper studies the effects of self-masking and multiple path sensitization on determining criticality of fan-out stem, and the accuracy of the algorithm is improved. Based on an 18-valued algebra in symbolic simulation, stuck-at faults and transition faults can be detected simultaneously, and the efficiency of the algorithm is improved. Critical path tracing algorithm, considering self-masking and multiple path sensitization in determining the criticality of fan-out stem, is implemented with the C-k＋ language. The improved algorithm is applied to ISCAS85 standard circuits for fault diagnosis, and experimental results prove the accuracy and efficiency of the algorithm.

关 键 词：临界路径跟踪算法 自屏蔽 多路敏化 C++ 

分 类 号：TP31[自动化与计算机技术—计算机软件与理论]