二维光电自准直仪中分划板研究  

Study on reticle in two-dimensional photoelectric auto collimator

作　　者：王晔[1] 于建楠[1] 周志炜[1] 

机构地区：[1]中国电子科技集团公司第四十九研究所,黑龙江哈尔滨150001

出　　处：《传感器与微系统》2016年第12期24-26,29,共4页Transducer and Microsystem Technologies

摘　　要：根据二维光电自准直仪的工作原理和结构特点,针对V形分划板、N形分划板和M形分划板在线阵CCD器件增维测量中的作用原理进行了研究,得出其在增维测量中的优点和缺点,为不同应用条件的二维光电自准直仪选用分划板提供了参考依据。Based on working principle and structure characteristics of two-dimensional photoelectric autocollimator,effect principle of V-shape and N-shape and M-shape forms of reticle in line array CCD in dimension increasing measurement is studied,in its advantages and disadvantages dimensional increasing measurement is obtained provide reference for reticle selection in different application conditions for twodimensional photoelectric autocollimator.

关 键 词：光电自准直仪 增维 分划板 

分 类 号：TP212[自动化与计算机技术—检测技术与自动化装置]