基于NIOS II嵌入式系统的芯片自动测试系统设计  

Design of an Automatic Testing System Based on NIOS II Embedded System

作　　者：刘忠超 

机构地区：[1]连云港杰瑞电子有限公司,江苏连云港222006

出　　处：《电子质量》2016年第12期84-87,共4页Electronics Quality

摘　　要：随着国内芯片产业的不断发展,芯片供货需求大,但是批量测试无法满足供货要求,为此,该文提出一种基于NIOS II嵌入式系统的芯片自动测试系统设计。NIOS II是Altera公司推出的一种高效、灵活的可编程片上系统,由内置NIOS II软核处理器[1]、存储器、通信接口以及自定义外设构成,编写下位机自动测试控制程序并下载进FPGA,使用串口进行上下位机通信,从而完成芯片自动测试系统设计。With the constant development of integrated circuit industry in domestic,the problem of chip batch testing becomes prominent,which can not meet the demand of mass production.Therefore,this paper proposes a chip automatic testing system based on NtOS II embedded system,which is an efficient and flexible programmable system on chip introduced by AItera company.The system include an internal NtOS II soft p- rocessor,memory,communication interface and the customization of peripherals,through writing the low machine control program and download into FPGA,and communicating with PC through Serial port,it can realize the automatic testing system.

关 键 词：NIOS II 嵌入式系统 集成电路 自动测试系统 

分 类 号：TN407[电子电信—微电子学与固体电子学]