微波单缝衍射实验中杂波的理论解释与计算  

Theoretical explanation and calculation about clutter in single slit diffraction experiment

作　　者：邵坤[1] 龙洋[1] 张志华[1] 王晓栋[1] 杜艾[1] 方恺[1] 

机构地区：[1]同济大学物理科学与工程学院,上海200092

出　　处：《物理实验》2016年第12期19-21,共3页Physics Experimentation

基　　金：同济大学教学改革研究与建设项目;同济大学精品实验项目;同济大学实验教学改革项目;2015年上海高校本科重点教学改革项目

摘　　要：利用惠更斯-菲涅耳原理论证了微波分光计单缝衍射实验中所采用的傍轴近似下的理论公式的可行性,并研究了不同缝宽下的衍射强度分布情况,对不同条件下的实验结果提供了一定的理论解释.考虑杂波对衍射强度分布的影响情况,计算其对实验的影响程度,并提出了一定的修定方案.计算并解释实验中衍射分布不对称的原因,并计算不对称对实验结果的影响程度.Using the Huygens-Fresnel principle, the feasibility of theoretical equation in paraxial ap- proximation condition was proved in single slit diffraction experiment by microwave spectrometer. The distribution of diffracted intensity was researched at different slit width. Some theoretical expla- nations were offered for the experimental results in different conditions. The improved method was presented by considering the influence of clutter on the diffraction intensity distribution and calculat- ing its influence on the experiment. The reason of the asymmetric diffraction was explained, its effects on the experiment was also calculated.

关 键 词：微波分光计 单缝衍射 杂波 衍射强度 

分 类 号：O436.1[机械工程—光学工程]