霉菌对Ge、ZnS和ZnSe膜层的影响  

Impact of Fungus on Films on Ge,ZnS and ZnSe

作　　者：杨玉萍 字正华[2] 钟辉[3] 江学军 李大庆[5] 刘剑 赵远荣 

机构地区：[1]国营第二九八厂 [2]昆明物理研究所 [3]中国人民解放军78336部队 [4]陆军重庆军事代表局驻昆明地区军事代表室 [5]中国人民解放军63963部队

出　　处：《红外技术》2016年第12期1078-1081,共4页Infrared Technology

基　　金：国防技术基础科研项目(H092013A009)

摘　　要：采取自然环境试验和实验室霉菌试验相结合的方法,研究霉菌对Ge、ZnS和ZnSe镀增透膜和碳膜的影响。通过显微镜和扫描电镜对霉菌试验结果进行观察和检测。试验结果表明:未镀膜的Ge、ZnS和ZnSe材料抗霉能力较强;增透膜和碳膜抗霉能力较弱,容易长霉,其主要长霉原因是增透膜和碳膜为霉菌生长提供了营养成分。The impact of fungus on antireflection films and carbon films on Ge, ZnS and ZnSe is analyzed by natural environment test and fungus test in the laboratory. The result of the test is observed and detected by microscope and scanning electron microscopy. The experimental results Show that the anti-mycotic of Ge, ZnS and ZnSe is stronger, while the anti-mycotic of antireflection films and carbon films are weaker. The main reasons are that antireflection films and carbon films nrovides nutrients for fungus growth.

关 键 词：Ge ZNS ZNSE 增透膜 碳膜 霉菌 

分 类 号：TN213[电子电信—物理电子学]