弹载行波管贮存寿命评估方法研究  

Study on an Assessment Method for Long-Term Storage Life of Missile-Borne TWTs

作　　者：吴钢[1] 苏小刚[1] 龚海华[1] 王娟[1] 

机构地区：[1]北京真空电子技术研究所,北京100015

出　　处：《真空电子技术》2016年第6期68-71,共4页Vacuum Electronics

摘　　要：本文提出一种新的长期贮存寿命的评估方法。长期贮存寿命是弹载行波管的重要指标。首先,本文通过实验标定离子流与真空度的对应关系,然后再用检测离子流来间接反映行波管真空度,判断行波管长期贮存寿命。通过试验数据分析,某弹载行波管长期贮存寿命预测超过20年。（Beijing Vacuum Electronics Research Institute, Beijing 100015, China） This paper introduces a new assessment method for long-term storage life,which is an important index for a missile-borne TWT. First, the corresponding relationship between ion current and vacuum degree was calibrated by experi-ments, then the vacuum degree of the traveling wave tube is indirectly reflected by the detection of the ion current, and so the long-term storage life of the TWT is judged. Through data analysis, the long-term storage life of a missile-borne TWT is predicted to be more than 20 years.

关 键 词：贮存寿命 真空 评估方法 

分 类 号：TN124[电子电信—物理电子学]