大规模数字电路系统可测性设计技术研究  

Research of the design for test technology in large scale digital system

作　　者：张昊[1] 

机构地区：[1]西南电子技术研究所,四川成都610000

出　　处：《微型机与应用》2017年第2期28-31,36,共5页Microcomputer & Its Applications

摘　　要：为满足大规模数字电路系统测试、故障诊断的需要,可测性(DFT)设计已成为大规模数字电路系统设计中不可或缺的重要组成部分。结合边界扫描测试原理和大规模数字电路系统的主要特点,研究DFT实现的技术途径,并将其用于某大规模数字电路系统的设计中。实现了该大规模数字电路系统的一键式互连故障诊断及可扫描网络准确定位,有效简化了测试复杂度。To satisfy the needs of large scale digital system test and fault diagnose,the design for test（ DFT） technology has become an indispensable and important part of digital system design. Based on the boundary scan principle and the main characteristic of large scale digital system,the implementation of DFT in the actual system was researched. Finally,it proved that the interconnect faults diagnose can be implemented by one key after the DFT was applied,and the interconnect faults can be located exactly. The test complexity is reduced effectively.

关 键 词：大规模数字电路测试 边界扫描 故障诊断 

分 类 号：TP216[自动化与计算机技术—检测技术与自动化装置]