基于相同数据位的SoC测试数据压缩方法  

A STUDY ON THE TEST DATA COMPRESSION METHODS OF SYSTEM-ON-CHIP(SOC) BASED ON THE SAME TEST DATA BITS

作　　者：黄贵林[1] 

机构地区：[1]巢湖学院,安徽巢湖238000

出　　处：《巢湖学院学报》2016年第6期15-19,共5页Journal of Chaohu University

基　　金：巢湖学院校级科研资助项目(项目编号:XLY-201409);安徽省省级教学研究项目(项目编号:2014jyxm331);安徽省省级特色专业计算机科学与技术省级特色专业(项目编号:2013tszy020);安徽省高校省级教学团队(项目编号:2016jxtd083)

摘　　要：随着VLSI技术的不断发展,集成电路所需的测试数据量也在不断增加,给测试带来了一系列问题,对自动测试设备(ATE)的存储容量提出了挑战,有限的带宽延长了测试数据传输时间。为此,提出了一种针对相同数据位的测试数据压缩及解压算法。数据位为全0或全1的数据块,编码压缩为仅为两位的控制位和编码位,与同类经典方案相比,实验表明该方案有效提高了测试数据压缩率,平均压缩率达到63.58%,且编码算法简单。With the continuous development of very large scale integration（VLSI）, the amount of test data required by integrated circuits is increasing, which causes a series of problems to test, and brings great challenges to the storage capacity of automatic test equipment（ATE）. The limited bandwidth of ATE lengthens the transmission time of test data. Therefore, a new algorithm of test data compression/decompression is proposed based on the same bits of test data. For the data block whose data bits are all 1 or 0, the code is compressed into only two-bit control bit and two-bit encoding bit. Compared with the other classical ways, the experimental results shows that this way effectively improved the compression ratio whose average ratio increases by 63.58%, and the encoding algorithm is simpler.

关 键 词：数据块 测试数据 压缩 无关位 

分 类 号：TP302[自动化与计算机技术—计算机系统结构]