工业生产中集成电路失效分析案例解析  

Analysis and Discussion of IC Failure Analysis Cases in Industrial Production Fields

作　　者：郭宇楠 王佳男[2] 丁宁[1] 

机构地区：[1]中国电子科技集团公司第四十七研究所,沈阳110032 [2]北方重工集团有限公司工程成套分公司,沈阳110141

出　　处：《微处理机》2016年第6期9-11,14,共4页Microprocessors

摘　　要：针对工业生产领域集成电路在使用中出现失效的问题,结合国产某型号厚膜集成电路和国产某重点型号大型盾构设备主控系统电路板的失效分析过程,介绍了工业生产中集成电路失效分析的方法和流程,并给出了具体分析思路,详细论述了失效分析过程。通过对失效现象的分析定位故障点,找出引起失效的原因并给出预防措施。失效分析工作既可以帮助集成电路企业纠正设计、生产和测试过程中的问题,也可以协助集成电路使用者发现使用过程中存在的不合理性,提高集成电路研发和使用双方的整体技术能力。Aiming at the failures of the integrated circuits which are used in industrial production fields,the specific thinking is given,the failure analysis processes are discussed in detail,and the methods and procedures of the integrated circuits,with the failure analysis processes of the domestic thick film integrated circuit and the main control system circuit board of the domestic large shield machine,are introduced. By analyzing the failure phenomena, the faults are located and the causes and the precautionary measures are found. Failure analysis can help IC design enterprises to correct the problems in design,production and testing,and help users to detect the unreasonable parts and improve the techniques of the IC design enterprises and users.

关 键 词：集成电路 厚膜集成电路 盾构设备 失效分析 

分 类 号：TN4[电子电信—微电子学与固体电子学]