某电子设备随机振动疲劳寿命仿真分析  

Analysis of Random Vibration Fatigue Life of a Electronic Equipment

作　　者：张云[1] 吴圣陶[1] 曾柯杰[1] 李崧[1] 

机构地区：[1]中国电子科技集团公司第三十研究所,四川成都610041

出　　处：《电子机械工程》2016年第6期25-28,共4页Electro-Mechanical Engineering

摘　　要：文中分析了某电子设备疲劳寿命。首先,通过ANSYS随机振动的功率谱密度(Power Spectral Density,PSD)分析得出设备的1σ应力分布;然后,利用高斯三区间法和Miner累积损伤定律得出了疲劳失效部位预估。仿真结论与后续的试验结果较一致,证实了此方法在电子设备的疲劳寿命分析领域有一定实践指导价值。In this paper,the fatigue life of a electronic equipment is analysed. First,we get the equipment’ s1σ stress distribution via PSD（Power Spectral Density） analysis in the ANSYS software. Then,using the Gaussian three interval method and Miner cumulative damage law,the equipment’s fatigue life is analyzed. The analysis results are similar with the following experiment results,which proved that the method used in this paper is helpful in the fatigue life analysis of electronic equipments.

关 键 词：电子设备 随机振动 疲劳寿命 谱分析 PSD 

分 类 号：TB533.1[理学—物理]