微波暗室装贴吸波材料的反射损耗测试研究  

Research on Absorb Materials Glued in Anechoic Chamber of Wave Reflection Loss Test

作　　者：王桂娟 宋立军[2] 刘浩 张福荣 

机构地区：[1]中国电子科技集团公司第五十四研究所 [2]北方工程设计研究院有限公司

出　　处：《安全与电磁兼容》2017年第1期35-37,共3页Safety & EMC

摘　　要：介绍了吸波材料反射损耗测试常用的时域法和弓形法,研究了已经装贴到暗室侧壁的吸波材料的测试方法,并进行了实际测试验证。结果表明,时域法测试忽略了收发天线间的耦合对测试结果的影响。对时域测试法提出了两点改进措施,获得了一种比较可靠实用的微波暗室现场测试吸波材料性能的方法。Two kinds of testing melhods, including lime domain melhod and arch test method, are briefly introduced. The reflection loss test method for absorb materials glued in anechoic chamber is studied. The deficiency of the original time-domain method is put forward. The effect of the coupling between the transmitler and lhe receiver is neglected, which greatly affects the accuracy of the test results. Two improvements of the original time domain lest method is put forward, a test method for the performance of wavc absorbing materials that more reliable and practical is gained.

关 键 词：吸波材料 反射损耗 时域法 弓形法 

分 类 号：TB302[一般工业技术—材料科学与工程]