一种基因芯片光学扫描图像倾斜校正方法研究  

Study on skew correction method for gene-chip scanning image based on pixel gray

作　　者：刘全金[1,2] 赵志敏[1] 张文杰[1] LIU Quanjin ZHAO Zhimin ZHANG Wenjie(College of Science, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, Jiangsu, China School of Physics ＆ Electronic Engineering, Anqing Normal University, Anqing 246011, Anhui, China)

机构地区：[1]南京航空航天大学理学院,江苏南京211106 [2]安庆师范大学物理与电气工程学院,安徽安庆246011

出　　处：《光学技术》2017年第2期108-113,共6页Optical Technique

基　　金：国家自然科学基金(10172043;61475071);安徽省自然科学基金(1608085QF157)

摘　　要：针对在基因芯片光学扫描时产生的图像倾斜问题,提出了一种基于像素灰度的芯片图像倾斜校正方法。结合基因芯片图像的结构特点,基于行、列方向像素灰度定义芯片图像的校正指标。在角度检测范围内,利用折半搜索方法,基于校正指标来检测芯片图像的校正角度和芯片图像的校正位置。实验结果表明,该方法能有效地检测多类基因芯片图像的倾斜角度,具有较强的鲁棒性和实用性。Based on pixel gray value, a skew correction method is proposed for the tilt image generated in gene-chip scanning. According to the structural characteristics of the gene-chip image, a correction index is determined based on gray of pixels on row and column. Within the range of angle detection, a binary search method is used to detect the skew angle of the gene-chip image based on the correction index. Strong robutstness and high performance of the skew correc- tion method proposed are observed in experimental results when diffrent types of gene chip images are used.

关 键 词：信息光学 基因芯片图像 像素灰度 倾斜校正 

分 类 号：O438[机械工程—光学工程] TP391[理学—光学]