X射线吸收精细结构在材料科学中的应用  

Applications of X-Ray Absorption Fine Structure in Materials Science

作　　者：王宇[1] 李炯[1] 张硕[1] 马静远[1] 汪丽华[1] 魏向军[1] 黄宇营[1] 姜政[1] 

机构地区：[1]中国科学院上海应用物理研究所上海光源,上海201204

出　　处：《中国材料进展》2017年第3期188-194,共7页Materials China

基　　金：国家自然科学基金项目(11275258;11135008;11405252);科技部"973"计划项目(2013CB933104)

摘　　要：X射线吸收精细结构(XAFS)方法是随着同步辐射发展起来的独特技术,是研究材料局域原子结构和电子结构的一种重要方法。相比于X射线衍射,XAFS仅仅对于吸收原子周围局域结构敏感,样品可以是固体、液体甚至是气体。概述了XAFS的基本原理及几种常用的实验方法,结合上海光源的XAFS光束线站成果,介绍了近年来不同XAFS方法在催化、能源、纳米和半导体等材料科学热门研究领域的最新进展,展示了目前XAFS方法在材料科学研究中所发挥的重要作用。最后根据国内同步辐射光源和相关XAFS研究方法的进一步发展,展望了XAFS技术在材料科学研究中的应用前景。X-ray absorption fine structure （XAFS） is a very powerful technique to investigate the local electronic and geometrical structure around the photoabsorber, which is developed along with synchrotron radiation. Compared with x-ray diffraction （XRI））, XAFS is solely sensitive to the local structure of atoms neighboring the absorbing one, and has been exploited for studying condensed matter, solution, even gas. In this review, the basic principle and several experiment methods of XAFS have been reported. Combined with scientific results of XAFS station （ Beamline 14W1 ）, we highlight recent applications of XAFS on catalytic materials, energy materials, nanomaterials, semiconductor materials and other hot fields of materials science research, as well as introduce the important roles XAFS played in materials science research. At last, possible applications of XAFS are discussed according to the developing trend of XAFS method at home.

关 键 词：材料科学 同步辐射 XAFS 时间分辨的XAFS 原位XAFS 

分 类 号：O657.3[理学—分析化学]