A highly pixelated CdZnTe detector based on Topmetal-II^- sensor  

A highly pixelated CdZnTe detector based on Topmetal-II^- sensor

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作  者:邹曙光 樊艳 孙向明 黄光明 裴骅 王珍 刘军 杨苹 王东 

机构地区:[1]PLAC, Key Laboratory of Quark & Lepton Physics (MOE), Central China Normal University, Wuhan, Hubei 430079, China

出  处:《Chinese Physics C》2017年第4期155-158,共4页中国物理C(英文版)

基  金:Supported by National Natural Science Foundation of China(11375073,11305072,U1232206)

摘  要:Topmetal-Ⅱ^-is a low noise CMOS pixel direct charge sensor with a pitch of 83 μm.CdZnTe is an excellent semiconductor material for radiation detection.The combination of CdZnTe and the sensor makes it possible to build a detector with high spatial resolution.In our experiments,an epoxy adhesive is used as the conductive medium to connect the sensor and cadmium zinc telluride(CdZnTe).The diffusion coefficient and charge efficiency of electrons are measured at a low bias voltage of-2 V,and the image of a single alpha particle is clear with a reasonable spatial resolution.A detector with such a structure has the potential to be applied in X-ray imaging systems with further improvements of the sensor.Topmetal-Ⅱ^-is a low noise CMOS pixel direct charge sensor with a pitch of 83 μm.CdZnTe is an excellent semiconductor material for radiation detection.The combination of CdZnTe and the sensor makes it possible to build a detector with high spatial resolution.In our experiments,an epoxy adhesive is used as the conductive medium to connect the sensor and cadmium zinc telluride(CdZnTe).The diffusion coefficient and charge efficiency of electrons are measured at a low bias voltage of-2 V,and the image of a single alpha particle is clear with a reasonable spatial resolution.A detector with such a structure has the potential to be applied in X-ray imaging systems with further improvements of the sensor.

关 键 词:Topmetal PIXEL CDZNTE 

分 类 号:TP212[自动化与计算机技术—检测技术与自动化装置] TN303[自动化与计算机技术—控制科学与工程]

 

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