MPM用小型化宽带行波管可靠性的Bayes方法估计  

Bayesian Reliability Assessment of Miniaturized Broadband TWTs for MPM

作　　者：王伟[1] 邵淑伟[1] 

机构地区：[1]北京真空电子技术研究所,北京100015

出　　处：《真空电子技术》2017年第1期18-21,共4页Vacuum Electronics

摘　　要：微波功率模块(MPM)集合了电真空器件和固态器件的优点,是未来军用微波领域的重要研究方向,作为MPM核心器件的行波管的可靠性研究就显得尤为重要。本文基于Bayes理论的无失效数据分析方法,建立了数学模型,推导出产品失效率λ的后验分布计算公式,并结合实例对应用于某型MPM的小型化宽带行波管的可靠性指标失效率和平均无故障工作时间进行了预估,结果表明,该方法的计算结果符合工程实际,对其他行波管产品的可靠性分析也具有借鉴意义。Combining advantages of vacuum devices and solid state devices, MPM is an important research objective in future military microwave field. And so the research on reliability of TWTs, which are core components in MPM, is particularly important. In this paper, reliability mathematic model was built by no-failure data analysis method based on Bayes theory. The formula for failure rate of posterior distribution was derivate, and was used to estimate the failure rate and MTBF in certain type miniaturized broadband TWTs for MPM. The research shows that the calculation results fit the actual situation well, and it can be used as reference to reliability assessments for other TWTs.

关 键 词：宽带行波管 失效率 BAYES方法 

分 类 号：TN124[电子电信—物理电子学]