Quantum-mathematical model of edge and peak point in Fresnel diffraction through a slit  

作　　者：罗晓贺 惠梅 朱秋东 王姗姗 侯银龙 

机构地区：[1]Beijing Key Laboratory of Precision Photoelectric Measuring Instrument and Technology, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China

出　　处：《Chinese Physics B》2017年第5期140-147,共8页中国物理B（英文版）

基　　金：Project supported by the National Natural Science Foundation of China(Grant No.61475018)

摘　　要：The intensity distribution in Fresnel diffraction through a slit includes numerous small fluctuations referred to as ripples. These ripples make the modelling of the intensity distribution complicated. In this study, we examine the characteristics of the Fresnel diffraction intensity distribution to deduce the rule for the peak position and then propose two types of quantum-mathematical models to obtain the distance between the edge and the peak point. The analysis and simulation indicate that the error in the models is below 0.50 μm. The models can also be used to detect the edges of a diffraction object, and we conduct several experiments to measure the slit width. The experimental results reveal that the repetition accuracy of the method can reach 0.23 μm.The intensity distribution in Fresnel diffraction through a slit includes numerous small fluctuations referred to as ripples. These ripples make the modelling of the intensity distribution complicated. In this study, we examine the characteristics of the Fresnel diffraction intensity distribution to deduce the rule for the peak position and then propose two types of quantum-mathematical models to obtain the distance between the edge and the peak point. The analysis and simulation indicate that the error in the models is below 0.50 μm. The models can also be used to detect the edges of a diffraction object, and we conduct several experiments to measure the slit width. The experimental results reveal that the repetition accuracy of the method can reach 0.23 μm.

关 键 词：Fresnel repetition Fraunhofer numerous conduct deviation pixel deduce tensity modelling 

分 类 号：O436.1[机械工程—光学工程] O141.4[理学—光学]