纳米银线与Ag@SiO2的制备及表征  

Synthesis and Characterizations of Silver Nanowires and Ag@SiO_2

作　　者：李潇[1] 唐建国[1] 王瑶[1] 黄林军[1] 王彦欣[1] 刘海燕[1] Li Xiao Tang Jianguo Wang Yao Huang Linjun Wang Yanxin Liu Haiyan(The National Base of International Scientific and Technological Cooperation on Hybrid Materials, Institute of Hybrid Materials, Department of Material Science and Engineering, Qingdao University, Qingdao 266071 ,China)

机构地区：[1]国家高分子杂化材料国际合作基地,青岛大学杂化材料研究院,青岛大学材料科学与工程学院,山东青岛266071

出　　处：《山东化工》2017年第8期1-2,7,共3页Shandong Chemical Industry

基　　金：国家自然科学基金(51273096);国家自然科学基金(51373081);国家自然科学基金(51473082)

摘　　要：采用多元醇法制备出直径200 nm左右的纳米银线,然后在乙醇中以二氧化硅为壳层包覆纳米银线制备出壳层结构的纳米复合材料Ag@SiO_2。紫外分光光度计可以表征出纳米银线样品中的成分,分析紫外发射光谱可以证明纳米银线的生成;通过动态光散射粒径分布分析仪可以表征出纳米银线的粒径分布;电子透射电镜(TEM)可以表征出纳米银线及Ag@SiO_2的表面形态,并能测量出纳米银线的直径和二氧化硅壳层结构的厚度。Silver nanowires that about 200 nm of diameter was prepared by the polyol method, and then nanocomposites （Ag@SiO2 ） with core shell structure was synthesised by SiO2 that was as shell coating silver nanowires in ethanol. Silver nanowires canbe characterized by UV spectrophotometer, because the generation of silver nanowires can proved by UV emission spectrumanalysis. Dynamic light scattering can be used to characterize the size distribution of silver nanowires. Transmission electronmicroscopy （TEM） can be used to show the surface morphology of the silver nanowires and Ag@ SiO2. More importantly, thediameter of silver nanowires and SiO2 thickness of the shell structure ware measured.

关 键 词：Ag@Si O2 粒径分布 紫外光谱 TEM表征 

分 类 号：TB383.1[一般工业技术—材料科学与工程]