Optic flaws detection and location based on a plenoptic camera  

作　　者：栾银森 许冰 杨平 汤国茂 

机构地区：[1]Key Laboratory on Adaptive Optics,Chinese Academy of Sciences,Chengdu 610209,China [2]Institute of Optics and Electronics,Chinese Academy of Sciences,Chengdu 610209,China [3]University of the Chinese Academy of Sciences,Beijing 100049,China

出　　处：《Chinese Optics Letters》2017年第4期34-38,共5页中国光学快报（英文版）

基　　金：supported by the Key Scientific Equipment Develop Project of China(No.ZDYZ20132);the National“863”Program of China(Nos.G158603 and G158201)

摘　　要：In this Letter,we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics.Specifically,due to the extended depth of field of the plenoptic camera,a series of optics can be inspected efficiently and simultaneously.Moreover,the depth estimation capability of the plenoptic camera allows for locating flaws while detecting them.Besides,the detection and location can be implemented with a single snapshot of the plenoptic camera.Consequently,this method provides us with the opportunity to reduce the cost of time and labor of inspection and remove the flaw optics,which may lead to performance degradation of optical systems.In this Letter,we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics.Specifically,due to the extended depth of field of the plenoptic camera,a series of optics can be inspected efficiently and simultaneously.Moreover,the depth estimation capability of the plenoptic camera allows for locating flaws while detecting them.Besides,the detection and location can be implemented with a single snapshot of the plenoptic camera.Consequently,this method provides us with the opportunity to reduce the cost of time and labor of inspection and remove the flaw optics,which may lead to performance degradation of optical systems.

关 键 词：camera inspection optics detecting pixel opportunity mirrors locating illumination remove 

分 类 号：TP391.41[自动化与计算机技术—计算机应用技术]