CdTe探测器能量刻度与探测效率的模拟计算  

Energy Calibration and Detection Efficiency Simulation of CdTe Detector

作　　者：姚馨博 吴金杰[2] 王玉龙[2] 陈成[2,3] 王佳[2,4] 杨扬[2] 

机构地区：[1]浙江省计量科学研究院,浙江杭州310013 [2]中国计量科学研究院,北京100029 [3]成都理工大学,四川成都610059 [4]南华大学,湖南衡阳421000

出　　处：《计量学报》2017年第3期372-375,共4页Acta Metrologica Sinica

摘　　要：在实现对单能平行光子源的绝对测量之前,需要对CdTe探测器进行刻度。利用已知点源对CdTe探测器进行能量刻度,得到刻度曲线和能量分辨率,利用工业CT对CdTe探测器进行精确扫描,得到CdTe探测器内部结构,并以此为基础,利用MCNP5蒙特卡罗模拟程序建立CdTe探测器物理模型;计算20~150 keV能量段,能量间隔为1 keV每个能量点的探测效率,得到CdTe探测器的效率曲线图。发现CdTe探测器在低能段探测效率较高,但Te元素在27 keV和32 keV处产生了逃逸峰,探测效率有所下降,之后探测效率曲线呈现先上升后下降的趋势。CdTe detector need to be scaled before it detects the single parallel photon source. Based on the energy calibration graph and energy resolution by standard point source, accurate internal structure by CT scanning and the results of physical model calculated by MCNP5 Monte Carlo code can be achived. The detector efficiency graph can be obtained on 1keV step from 20keV to 150keV energy range. The detection efficiency is very well at lower energy range and becomes decline at the energy of 27keV and 32keV due to outcome of X-ray escape summits. Then the detector efficiency increases and then decreases with the growth of energy.

关 键 词：计量学 CdTe探测器 探测效率 蒙特卡罗模拟 CT扫描 

分 类 号：TB98[一般工业技术—计量学]