铜纳米线透明导电薄膜的制备及性能研究  

Study on Preparation and Properties of Copper-nanowire-based Transparent Conductive Film

作　　者：李曼妮[1] 张立[1] 郑水蓉[1] 尚蓓蓉[1] 齐暑华[1] 

机构地区：[1]西北工业大学理学院应用化学系,陕西西安710129

出　　处：《中国塑料》2017年第5期13-17,共5页China Plastics

摘　　要：采用液相化学还原法制备了铜纳米线(Cu NWs),并用喷涂法和线棒涂布法制备了聚偏氟乙烯(PVDF)/Cu NWs薄膜;采用扫描电子显微镜、X射线衍射仪、透射电子显微镜等仪器对产物形貌和相结构进行了分析,用紫外可见分光光度计和四探针测试仪分别对PVDF/Cu NWs薄膜的透光率和导电性进行了表征。结果表明,在126℃下反应2h制备的Cu NWs具有较高的长径比,直径约为60nm,长度为60~80μm,并且在诱导剂和稳定剂的共同作用下,所制备的产物具有较高的纯度和分散性;当Cu NWs的浓度为0.08mg/mL时,透光率为61%,表面电阻率为40.7Ω。Copper nanowires were first synthesized through a liquid phase reduction method,and then the PVDF/copper nanowire thin films were prepared by using spray coating and wire rod coating technologies.The crystalline structure of copper nanowires was determined by X-ray diffraction measurements,and their morphology was characterized by scanning and transmission electron microscopy.The light transmittance and surface electrical resistance of the thin film was obtained by a UV spectrometer and a four-point probe method,respectively.The results indicated that the prepared copper nanowires had a diameter of approximately about 60 nm,a length of 60～80 μm and a high aspect ratio,and they exhibited a high purity and a good dispersion with the help of synergistic effect from inducing agent and stabilizing agent.The thin film achieved a maximum light transmittance of 61 % and manimum surface resistance of 40.7 Ω at the copper nanowire concentration of 0.08 mg/mL.

关 键 词：铜纳米线 液相还原法 透明导电薄膜 聚偏氟乙烯 

分 类 号：TB383.2[一般工业技术—材料科学与工程]