薄膜磁阻效应计算机控制自动测试  

Film Magnetic-resistance Effect Automeasured by Computer Control

作　　者：崔甲武[1] 宋金璠[1] 周雁青 张绍武[3] 

机构地区：[1]南阳师范学院物理系,河南南阳473061 [2]南阳电力技校,河南南阳473009 [3]河南省科学院应用物理研究所,河南郑州450008

出　　处：《济南大学学报（自然科学版）》2002年第2期200-202,共3页Journal of University of Jinan(Science and Technology)

基　　金：河南省教育厅科研项目 (编号 :2 0 0 0 14 0 0 0 8)

摘　　要：采用单片机 80 31模拟三角波输出而产生超低频扫场电源 ,克服阻容元件线差波形不稳定 ,用 8位单片机与 16位数模转换器进行接口 ,给出了控制系统、D/A转换、恒流和功率驱动电路以及软件设计 ,以四探针、六探针法测量 。The ultraflow frequency scanning field power supply is obtained by chip microprocessors 8031 simulating trangular wave output.The problem of the unstablity of wire difference and waveform of resistance capacipy element is solved,chip microprocessor of 8 units and the data mode converter of 16 units are used to make the interface,the contral system,D/A conversion,the constant-rate of flow,the power driving electric circuit and the software design are provided.The thin film magnetic-resistance effect is measured automatically by four probes and six probes measure methods.

关 键 词：薄膜磁阻效应 探针 单片机 

分 类 号：TM271.2[一般工业技术—材料科学与工程]