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机构地区:[1]天津大学内燃机研究所,天津300072 [2]天津市天波科达科技有限公司,天津300034
出 处:《热固性树脂》2017年第3期30-34,共5页Thermosetting Resin
基 金:天津市科技计划项目(14ZXCXGX003)资助
摘 要:采用常压封装工艺制备带气泡的环氧树脂电容式封装件,通过高压电载荷实验,结合破坏性物理分析方法(DPA)、光学显微镜(OM)、扫描电子显微镜(SEM)及其配备的能谱分析仪(EDS)等手段,对环氧树脂发生气隙放电前后的形貌结构、元素组成等进行了表征分析。结果表明:环氧树脂内部残留气泡在高压载荷下容易率先发生气隙局部放电现象,同时在放电附近引起一定程度的环氧树脂基体老化。在放电过程中,环氧树脂与电极界面的形貌、结构以及化学组成都发生了明显的变化,存在明显的氧化反应。该研究有助于改善环氧树脂等材料的绝缘性能及其应用领域的绝缘可靠性能。The epoxy resin packaged capacitor with residual bubbles was prepared by a normal pressure packaging technology. With the high-voltage electric loading experiments, the morphologies, structure, chemical element composition of the the epoxy resin were characterized by the DPA, OM, SEM and its equipped EDS. The results showed that the partial-discharging phenomenon was easily occurred at the bubbles residues in epoxy resin, accompanied with a certain degree of epoxy resin aging around the discharging point. During the bubble partial-discharging process, the morphologies, structure and chemical elements of the interface between the epoxy resin and the copper electrode were obviously changed and remarkable oxidation reactions were existed. This research was helpful to improve the insulating property of the materials such as epoxy resin and their insulating reliability in the related application fiehls.
关 键 词:环氧树脂 电载荷 气隙局部放电 氧化反应 绝缘可靠性
分 类 号:TQ323.5[化学工程—合成树脂塑料工业]
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