低压断路器短路试验中闭合电器的研究  

Analysis on the Closing Device in Short Circuit Test of Low Voltage Circuit Breaker

作　　者：李合[1] 姜宁[1] 冯建强[1] 

机构地区：[1]西安高压电器研究院有限责任公司,陕西西安710077

出　　处：《电器与能效管理技术》2017年第10期52-55,共4页Electrical & Energy Management Technology

摘　　要：短路试验是检测低压断路器电气性能的重要试验。以国家标准中规定的短路试验为依据,以试验回路中的闭合电器为研究对象,对其特性进行分析,同时对其在回路中的位置设置加以改进,最后进行仿真验证。结果表明,改进后既可满足标准要求,又可降低试验设备成本及受损伤的风险,为试验回路的设计提供参考。Shortcircuit test is an important test to detect the low voltage circuit breaker electrical properties. This paper discussed features of the closing device in the test circuit,based on national standard＇ s short circuit test procedure. Then it is verified to improve its position in the circuit by simulation analysis. The results prove that it can both meet the standard requirement,and reduce the test equipment cost and the risk of damage. It provides the reference for design of the test circuit.

关 键 词：国家标准 短路试验 闭合电器 仿真分析 

分 类 号：TM561[电气工程—电器]