声表器件质量管理与质量风险相关性分析  

Analysis of Correlation Between Quality Management and Quality Risk of Surface Acoustic Wave Devices

作　　者：支越[1,2] 梅强[1] 王之哲 王小强[2] 刘焱[2] 

机构地区：[1]江苏大学管理学院,江苏镇江212013 [2]工业和信息化部电子第五研究所,广东广州510610

出　　处：《压电与声光》2017年第3期479-482,共4页Piezoelectrics & Acoustooptics

摘　　要：声表面波器件因体积小,质量小,信号处理简单,适于批量生产及可靠性高等优点,在雷达、通信、导航和电视等领域有着广阔的应用前景。目前,我国声表面波器件产品检验合格率相对偏低,质量不高,制约了整个行业的发展。该文通过分析电子元器件质量管理要素与质量风险间的相关性,提出了一种能够通过评价电子元器件质量管理水平预测其质量风险的方法,为声表器件研制企业改善产品质量风险提供了借鉴与参考。With the advantages of small size,light weight,ease to signal processing,potential of mass production and good reliability,surface acoustic wave devices have widely been employed in the field of radar,telecommunication,navigation,television and so on.However,the qualification rate of surface acoustic wave devices in our country has been relatively low and its quality needs to be improved,which limited the development of surface acoustic wave device industry.Thus an analysis method to evaluate quality risk of electron devices through their quality management status has been proposed by analyzing the correlation between the quality management elements and quality risk of electron devices,which is instructive for the improvement of quality risk of surface acoustic wave devices.

关 键 词：声表面波 质量管理 质量风险 相关性 递阶偏最小二乘法 

分 类 号：TN384[电子电信—物理电子学]