嵌入式开发平台的硬件自测试技术研究  

The hardware self-test technology of the embedded development platform

作　　者：禤俊峰 Xuan Junfeng

机构地区：[1]广州大学纺织服装学院电子与信息工程系,广东广州510165

出　　处：《电子技术（上海）》2017年第5期11-14,共4页Electronic Technology

摘　　要：提出了一种适用于嵌入式开发平台的硬件自动测试技术。测试平台通过设置识别系统以获取接入平台硬件的信息,通过上位机配置测试用例,利用嵌入式处理器以及测试配套硬件完成对硬件模块的故障测试。实验结果表明,该测试技术能有效对接入开发平台的硬件模块实施识别与测试,实现了较高的自动化测试水平。This paper presents a hardware automatic test technology for embedded development platform. The test platform is set up the recognition system to get the information of the hardware of the access platform, the test cases are configured by the upper computer, and the hardware modules are tested by the embedded processor and the hardware. The experimental results show that the technology can effectively identify and test the hardware module of the development platform, and achieve a high level of automation testing.

关 键 词：开发平台 硬件识别 自动测试 上位机 

分 类 号：TP273[自动化与计算机技术—检测技术与自动化装置]