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作 者:王成刚[1] 刘泽巍[1] 袁媛[1] 李冬冰[1] 喻松林[1] WANG Cheng-gang LIU Ze-wei YUAN Yuan LI Dong-bing YU Song-lin(North China Research Institute of Electro- optics, Beijing 100015, China)
出 处:《激光与红外》2017年第6期736-739,共4页Laser & Infrared
摘 要:集成电路制造技术的发展使单芯片集成多谱段红外探测器成为可能,其中长线列红外探测器读出电路设计遇到的挑战之一就是寄生效应。针对一款多谱段长线列用读出电路在最小积分电容时行间输出电平差异显著,导致成像出现明暗条纹的现象进行了测试分析,得出复杂的电路版图寄生效应是主要原因。通过优化设计及流片验证,解决了寄生效应导致的成像明暗条纹问题。With the development of integrated circuit manufacture,it is possible to integrate multispectral linear array infrared detector on one chip. One of the major challenges is parasitic effects in ROIC design for long linear array. This paper analysed an ROIC design for multispectral long linear array which encountered obvious difference for ultra - small integrate capacitor between consecutive line output while the input unchanged, which results in bright - dark line in an image. Thorough testing and analyzing, the cause was found due to the parasitic effects of the complicated circuit layout. A more robust layout design was taped out and the problem was resolved.
分 类 号:TN214[电子电信—物理电子学]
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