Determining maximum shear stress in confined substrate from elastic wave reflection coefficient  

作　　者：LIU JinXia CUI ZhiWen WANG KeXie Tribikram KUNDU 

机构地区：[1]Department of Acoustics and Microwave Physics, College of Physics, Jilin University [2]State Key Laboratory of Acoustics, Institute of Acoustics, Chinese Academy of Sciences [3]Department of Civil Engineering and Engineering Mechanics, University of Arizona

出　　处：《Science China Earth Sciences》2017年第6期1147-1158,共12页中国科学（地球科学英文版）

基　　金：supported by the National Natural Science Foundation of China (Grant Nos. 41474098, 11134011);by State Key Laboratory of Acoustics (Grant No. SKLA201608)

摘　　要：The relationship between the maximum shear stress in a substrate solid and the elastic wave reflection coefficient from the interface between the substrate solid and an overlying solid half-space is investigated. Both substrate and overlying solid media are assumed to be initially isotropic and stress-free. Then as the substrate is subjected to horizontal confined stresses it becomes anisotropic. It is shown that longitudinal and shear wave reflection coefficients are related to the degree of stress induced anisotropy in the substrate medium. From this relation the confined stress level and the maximum shear stress generated on the vertical planes of the substrate are estimated. Authors in their previous investigation computed plane wave reflection coefficient in a biaxially compressed solid substrate immersed in a fluid. This paper reports for the first time how the maximum shear stress in a biaxially compressed substrate medium can be measured from the plane wave reflection coefficients when the overlying medium is also a solid half-space.The relationship between the maximum shear stress in a substrate solid and the elastic wave reflection coefficient from the interface between the substrate solid and an overlying solid half-space is investigated. Both substrate and overlying solid media are assumed to be initially isotropic and stress-free. Then as the substrate is subjected to horizontal confined stresses it becomes anisotropic. It is shown that longitudinal and shear wave reflection coefficients are related to the degree of stress induced anisotropy in the substrate medium. From this relation the confined stress level and the maximum shear stress generated on the vertical planes of the substrate are estimated. Authors in their previous investigation computed plane wave reflection coefficient in a biaxially compressed solid substrate immersed in a fluid. This paper reports for the first time how the maximum shear stress in a biaxially compressed substrate medium can be measured from the plane wave reflection coefficients when the overlying medium is also a solid half-space.

关 键 词：Shear stress Reflection coefficients Stress induced anisotropy 

分 类 号：P631.4[天文地球—地质矿产勘探]