电子断层三维重构技术在材料微观结构分析中的应用  

Reconstruction of Materials Microstructure by Electron Tomography

作　　者：唐明华[1] 郭军[1] 陈木子[1] 

机构地区：[1]苏州大学分析测试中心,江苏苏州215123

出　　处：《分析科学学报》2017年第3期411-414,共4页Journal of Analytical Science

基　　金：国家自然科学青年基金(No.21301333);实验室安全及设备管理教改项目(No.58333007)

摘　　要：电子断层三维重构技术是在透射电镜基础上发展起来的,用以解析材料三维结构的一种技术。本文以美国FEI公司Tecnai G^2 F20透射电镜三维重构系统——Xplore 3D系统为例,探讨了样品制备与取向的选择、样品漂移问题的成因与校正、降低缺失锲存在造成的模型失真及空间分辨率的提高等问题,从以上四个方面详细介绍电子断层三维重构技术的要点及在材料微观结构方面的应用经验。Electron tomography is a well-established technique based on transmission electron microscopy to recover the three-dimensional structure of an object from a series of projection images at different viewing angles. In this paper,a brief introduction and some practical experiences of electron tomography with transmission electron microscope（FEI, Tecnai G^2 F20） were illuminated. The details on sample preparation and orientation, sample drift correction, the reduction of missing wedge resulting in an insufficient 3D reconstruction and the improvement of spatial resolution were also discussed.

关 键 词：电子断层三维重构 透射电镜 材料微观结构 

分 类 号：O657[理学—分析化学]