ZnO衍射花样180°不唯一性的消除  

Elimination of 180° Nonuniqueness of ZnO Diffraction Pattern

作　　者：唐明华[1] 陈木子[1] 朱兴[1] 郭军[1] 闫春辉[1] TANG Ming-hua CHEN Mu -zi ZHU Xing GUO Jun YAN Chun-hui(Analysis and Testing Center, Soochow University, Suzhou 215123 , Jiangsu China)

机构地区：[1]苏州大学分析测试中心,江苏苏州215123

出　　处：《分析测试技术与仪器》2017年第2期130-134,共5页Analysis and Testing Technology and Instruments

基　　金：实验室安全及设备管理教改项目-图像重构技术(58333007);国家自然科学基金青年基金(21301333)

摘　　要：晶体电子衍射花样涉及到界面、位错等缺陷的晶体学性质测定时,需要设法消除180°不唯一性这一问题.应用Tecnai G^2 F20场发射透射电镜精密的倾斜样品台使晶体做有系统的倾转,观察衍射花样的变化并加以分析,从而消除了ZnO粉末单晶花样的180°不唯一性.In the determination of electron diffraction pattern of crystal involving interface, dislocation and other defects of crystallography properties, to eliminate the problem of 180° nonuniqueness is needed. In this article, using the precise specimen stage of transmission electron microscope （FEI, Tecnai G2 F20） the systematic tilting of crystals can be accomplished, and by the analysis and study of the changes of electron diffraction pattern, the selection of the right index of crystalline plane and index of zone axis, the elimination of 180° nonuniqueness of ZnO diffraction pattern can be achieved.

关 键 词：ZNO晶体 衍射花样 180°不唯一性 

分 类 号：O657.32[理学—分析化学]