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作 者:方伟明[1] 程汉湘[1] 李勇[1] 彭洁锋[1] 阳海彪
机构地区:[1]广东工业大学,广东广州510006
出 处:《电力电容器与无功补偿》2017年第3期26-31,共6页Power Capacitor & Reactive Power Compensation
基 金:广东省自然科学基金资助项目(S2011010004950)
摘 要:本文针对目前MCR型的磁控电抗器中的触发可靠性问题,详细介绍了MCR型磁控电抗器的过零检测电路和晶闸管驱动电路的设计思想,对硬件电路设计上进行了优化,对硬件进行了详细的可靠性分析。通过研究分析触发脉冲的幅值和宽度,进而提出了可增加晶闸管驱动可靠性的方案。实验结果表明本文所设计的过零检测电路和晶闸管驱动电路解决了晶闸管触发信号的时间基准问题。从而保证了MCR型磁控电抗器性能上的优越性。As for the issue of trigger reliability of present MCR type magnetically controlled reactor,the des-ign idea on the zero-crossing detection circuit and the driving circuit of thyristor for type MCR magn-etically controlled reactor is introduced in detail,the hardware design is optimized,and its reliability analysis is performed in detail. The proposal on improving the driving reliability of thyristor is raised by way of studying and analyzing the amplitude and width of the trigger pulse. The experimental results show that both the zero detection circuit and the thyristor driving circuit designed in this paper solves the issue of time reference of the thyristor trigger signal,thus assuring the performance superiority of type MCR mag-netically controller reactor.
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