基于UVM的功能覆盖率驱动SDIO IP验证  

UVM Based Functional Coverage-Driven SDIO IP Verification

作　　者：倪伟[1] 王笑天[1] 

机构地区：[1]合肥工业大学微电子设计研究所,合肥230009

出　　处：《微电子学》2017年第3期392-395,411,共5页Microelectronics

基　　金：国家自然科学基金资助项目(61204024)

摘　　要：在研究SDIO接口协议的基础上,采用以功能覆盖率驱动的验证方法和UVM验证方法学,构建了一个完整的SDIO IP验证平台。在自测试仿真实验中,通过各种测试用例,最终实现了功能覆盖率的收敛。仿真结果表明,该平台可以用于验证复杂的SDIO接口协议,且具有可复用性,可用于SoC系统的验证,缩短验证流程。Based on the study of SDIO interface protocol, a comprehensive SDIO IP verification platform was built by using the functional coverage-driven verification method and UVM verification methodology. In the self-test of this verification platform, the convergence of functional coverage had been achieved through a variety of test cases. The simulation results showed that this verification platform could be used to verify the complex SDIO interface protocol, as well as the SoC systems due to its reusability. This platform could also reduce the verification process.

关 键 词：SDIO UVM 功能覆盖率 验证 

分 类 号：TN47[电子电信—微电子学与固体电子学]