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作 者:于之靖[1] 王威[2] 王烁[1] 花贞 吴军[2] 诸葛晶昌[1]
机构地区:[1]中国民航大学电子信息与自动化学院,天津300300 [2]中国民航大学航空工程学院,天津300300
出 处:《半导体光电》2017年第3期445-450,458,共7页Semiconductor Optoelectronics
基 金:国家自然科学基金委员会与中国民用航空局联合项目(U1333105;U1533111);国家自然科学基金项目(61405246)
摘 要:一字线及编码(相移)光栅结构光扫描测量系统在复杂曲面数模过程中得到广泛应用,但不能同时保证较低的测量不确定度指标和复杂曲面数模结果的各向光顺性。文章采用双目视觉和十字光配置扫描测量方案,在有效降低测量不确定度指标的同时,利用正交配置的十字光平面,改善了复杂曲面数模结果的各向光顺性。针对十字光双目外极线约束匹配可能存在的多义性问题,提出了附加光平面约束,有效剔除了误匹配点。实验结果表明:该十字光匹配方法可行、具有较好的精度,为后续准确高效地进行空间三角测量奠定了基础。The light scanning measurement systems with the single-line and coded(phase shifted)grating structure is widely used in the reverse engineering of complicated curves.But the ambiguity problem of measuring and the fairness problem could not be solved in a same time.The scanning measurement scheme with binocular vision and cross-line structured light was used in this work.It could improve the ambiguity problem of measuring,and the fairness of the reverse engineering was improved.As for the problem of multi-result of cross-line structured light matching under the epipolar constraint,an additional light planar constraint was proposed to delete the mismatched points effectively.The experimental results showed that the cross-line structured light matching method had good accuracy and laid a solid foundation of the space triangulation.
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