电极表面状态对像增强器耐压性能的影响  

Influence of Surface Roughness on Breakdown Characteristics of Image Intensifier

作　　者：杨晓军[1,2] 焦岗成[1,2] 李世龙[1,2] 师宏立[1,2] 侯志鹏[1,2] 李丹[1,2] 邱洪金 黄武军[1,2] 

机构地区：[1]微光夜视技术重点实验室,西安710065 [2]北方夜视科技集团有限公司,昆明650223

出　　处：《真空科学与技术学报》2017年第6期549-554,共6页Chinese Journal of Vacuum Science and Technology

基　　金：微光夜视技术重点实验室项目(GY201627)

摘　　要：像增强器(简称像管)的耐压性能是影响其增益,背景噪声和分辨力的一个重要因素。引起像管电击穿的原因很多,其中,电极的表面形态在其击穿的起始阶段发挥着重要的作用。本文针对像管特有的高场强微间隙电场结构,通过对不同电极进行耐压测试实验,研究其对像管耐压性能的影响。运用表面形貌测试仪对电极表面进行3D形貌测试,结果表明电极表面微凸起形状和尺寸的不同对像管耐压性能的影响差异显著,提高材料表面光洁度对于提高像管耐压性能有着重要的促进作用,最终为突破高场强微间隙像管工艺制作技术提供理论依据。Here,weaddressed the mechanisms responsible for the voltage breakdown of the gap between microchannel plate（ MCP） and phosphor screen in an image intensifier tube. The impact of the surface microstructures of the electrodes,including the phosphor screen,MCP and kovar-alloy support-ring,on the field emission enhancement was theoretically analyzed and experimentally investigated with lab-built test-bench,high-power microscope and surface topographer. The results show that the breakdown behavior of the image intensifier tube strongly depends on the field enhancement,mainly originated from the localized protruding spots on the metal ring surface,such as micro-bumps,mechanical damagesdefects,but weakly on the surface roughness and porosity of the phosphor screen. We suggest that the highly smooth surface of MCP support-ring may improve the voltage breakdown properties of image intensifier tube.

关 键 词：像管 场致发射 表面状态 耐压性能 

分 类 号：TN223[电子电信—物理电子学] O46[理学—电子物理学]