空间外差光谱仪的干涉图校正  

Interferogram correction of spatial heterodyne spectrometer

作　　者：张文理[1] 田逢春[1] 赵贞贞[2] 张丽[1] Yang Simon X 宋安[1] Wenli Zhang Fengchun Tian Zhenzhen Zhao Li Zhang Simon X. Yang An Song(College of Communication Engineering, Chongqing University, Chongqing 400044, China College of Computer and Information Engineering, Henan University of Economics and Law, Zhengzhou 450000, China School of Engineering, University of Guelph, Ontario N1G 2W1, Canada)

机构地区：[1]重庆大学通信工程学院,重庆400044 [2]河南财经政法大学计算机与信息工程学院,郑州450000 [3]圭尔夫大学工程学院

出　　处：《光电工程》2017年第5期488-497,共10页Opto-Electronic Engineering

基　　金：重庆市基础科学与前沿技术研究专项项目(重点)(cstc2015jcyjB0493)

摘　　要：空间外差光谱技术(SHS)作为一种新型超光谱分辨率的光谱分析技术近年来得到了快速发展和广泛应用。根据SHS的基本结构和原理,本文对SHS应用系统中能对干涉图产生影响的各种干扰和畸变进行了分析,并针对这些干扰提出了一种SHS干涉图校正方案。实验结果表明,该方案不仅可以对干涉图进行有效校正,而且复原光谱能够良好地反映输入光谱信息,提高SHS的反演精度。Spatial heterodyne spectroscopy（SHS） has been rapidly developed and widely used in recent years as a new type of super-spectral resolution of spectrum analysis technology. According to the structure and principles of SHS, various kinds of interference and distortion of SHS application system which influence the interferogram are analyzed in this paper and a correction scheme of SHS interferogram for the suppression of the interference is proposed. Experimental results show that the proposed method can correct the interferogram effectively, and make the recovered spectrum reflect the input spectral information well and improve the inversion accuracy of the SHS.

关 键 词：空间外差光谱仪 畸变分析 干涉图校正 反演精度 

分 类 号：TH744.1[机械工程—光学工程]